Easy-Logic to Showcase its Latest ECO Technology for DFT at IIC Conference 2023, Shanghai
March 24, 2023
Release Date:2023-03-24    Views:    Source:


Easy-Logic will Showcase its Latest ECO Technology for DFT at IIC Conference 2023

Maintaining the Integrity of DFT and Updating It as Needed during ECO Operations


Easy-Logic Technology will present its functional ECO solution for Design-For-Test (DFT) in ASIC design at the 2023 International Integrated Circuit Conference and Symposium (IIC Conference) on March 29-30.

As the complexity of ASIC chips continues to increase, project schedules become increasingly tight, the need for RTL changes during the design process becomes more frequent. The Functional ECO operations required to address this issue pose a significant challenge to design teams, particularly DFT scan chain modifications. Easy-Logic Technology, a technology leader in the Functional ECO field of the EDA industry, will showcase its product's value at the exhibition.

Booth Number / Conference Venue

Booth 1F01, Shanghai International Convention Center


Regarding Functional ECO

The business benefits of a successful functional ECO cannot be overstated. This type of ECO work saves time and costs associated with re-spinning a project, and avoids the huge losses that may result from product delays. However, ECO work is not a simple operation.  The threshold for successful functional ECO is high, it is even more difficult for ASIC designers to modify the DFT scan chains which are automatically inserted by EDA tools, resulting in a decrease in chip test coverage or even missing the market window for the product.


Regarding ECO operations for DFT

Easy-Logic Technology's EasylogicECO is an optimal solution to help customers get ahead of their competitions. EasylogicECO fully supports DFT requirements during the ECO process - ensuring that test circuits, such as scan chains and MBIST, are not affected. Moreover, if new registers are added or old ones are removed from the ECO netlist, EasylogicECO can automatically update the scan chains while meeting the constraints of the test circuits, greatly shortening the turnaround time of the ECO.


At the exhibition, Easy-Logic's technical support team will demonstrate various functional ECO solutions. We welcome you to visit Easy-Logic Technology's booth and have an in-depth discussion on functional ECO or DFT scan chain modifications!


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